ScanWorks® Interconnect Repair Station Bundle
The easy, affordable and powerful JTAG solution for device, PCB and system test, and on-board programming.
Ideal for printed circuit board testing, the ScanWorks Interconnect Repair Station Bundle quickly and easily diagnoses defects on PCBs detected during manufacturing. A ScanWorks station dedicated to testing circuit boards and repair functions allows your development and manufacturing operations to continue their work uninterrupted while boards are repaired off-line. The Interconnect Repair Station accesses the built-in debug features of each ScanWorks test type but it does not include the ability to regenerate ScanWorks tests. Several of the major benefits of the Interconnect Repair Station are:
- Project Management — Import and run manufacturing tests with either the ScanWorks Sequencer or a custom user interface
- Comprehensive test application — Apply tests created on an Interconnect Development Station, including PLD and flash memory programming operations, and perform diagnostic operations on the PCB
- Consistent, intuitive user interface — Low learning curve with the same basic user interface as the Interconnect Development Station
- Maintain test integrity — By limiting access to test generation tools, the integrity of tests is maintained and are assured the same tests that detected defects are used for debug
- Quick defect isolation with pin-level diagnostics for interconnect test — Pin-level diagnostics identifies a defect to the most likely device pin
- Graphical views of the board layout and schematic are linked directly from fault reports, enabling you to quickly pinpoint the most likely location of the defect
The Interconnect Repair Station includes easy-to-use yet powerful features such as the design manager, scan path verification, pin-level diagnostics for interconnect tests, interactive debuggers for each test type, graphical fault highlighting and the test sequencer. Options can be added for locating defects with the interactive debugger and scan analyzer, and for creating custom tests with macros so you can control and observe specific device pins to isolate defects.