Back Plan (Mother Board) Tester using Boundary Scan




*    Open and short test for each pin in all the connectors

*    Using Digital tests methods.

*    Test time for all slots and connectors ~ 1-2 minutes

*    Uses parallel Xilinx POD as Boundary Scan Controller

*    Ability to test digital components and I2C programmable devices

*    Diagnostics in pin level in connector




Copyright � 2006 Anat Tessler